Hi All, I hope this is not too off-topic as it is not specifically a Rietveld question.
I am studying liquid data for an alloy containing Hf, and I am encountering some persistent problems with correction. I use the fluorescence correction in PDFgetX2 (thanks by the way for the great software, I am just beginning to use PDFfit as well) to correct the baseline at high q, but this leaves me with unphysically high intensity at low q (first peak in S(q)). Could the extra intensity after the fluorescence is removed be due to anomalous scattering? The incident x-ray intensity is 125 keV. The Hf K-edge is located at 65.4 keV. Any help would be appreciated, or if anyone knows of a good paper addressing a similar issue, I would love to know about it. Regards, Victor
