Hi all, I have a question using fix (FDS) and programmable slits (ADS) for Rietveld analysis. Actually, I work with a X'PERT equipment with fast detection and with programmable divergence slits in the incident beam and a programmable antiscattering slits in the diffracted beam. I have also the possibility to use them in a fix mode. I would like to know the opinion of the community about the best configuration of this slits (fix or programmable) if a Rietveld analysis is required. In fact, using programmable slits, the software corrects data and changes from ADS to FDS. What is the interest to use ADS in this case?
Thank you all Maria Fabra Puchol Microanalysis Engineer Saint-Gobain CREE --------------------------------------- 550, Avenue Alphonse Jauffret 84306 Cavaillon Cedex-France [EMAIL PROTECTED] telf: +33 (0)4 32 50 09 36 fax: +33 (0)4 32 50 08 51
