Call for papers for the 5th Size-Strain Conference
Dear Colleagues,
the "5th Size-Strain Conference" will take place at the Congress Centre
in Garmisch-Partenkirchen, Germany, in the time period October 7-9 2007
(have a look at the conference homepage www.mf.mpg.de/ss-v for further
information).
This conference on "the diffraction analysis of the microstructure of
matter" forms a focal point of presentation and discussion of scientific
developments in this multidisciplinary field of great importance to
materials scientists, solid state physicists and chemists, and the like.
You are all invited to participate in the Conference. Abstracts of
intended contributions should be submitted as attachments to the
conference e-mail address
[EMAIL PROTECTED]
The deadline for abstract submission is the 31st of March.
The abstracts should be prepared using Microsoft Word, available at the
above-mentioned web site.
Please indicate in your e-mail if you would prefer an oral or a poster
presentation and provide us with your full affiliation. Your e-mail
address will be used for further communication.
For your information, a provisional and incomplete list of confirmed
(status of today) keynote and invited lectures has been included at the
bottom of this e-mail.
Hoping to see you in Garmisch-Partenkirchen,
Andreas Leineweber
also on behalf of
Eric Mittemeijer, Chair
also on behalf of
Paolo Scardi, Co-Chair
Udo Welzel
INVITED CONTRIBUTIONS
O. Thomas (Univ. of Marseille)
Diffraction analysis of elastic strains in micro- and nano-structures
S. Billinge (Michigan State University)
Pair Distribution Function approach for characterization of nanocrystals
H. van Swygenhoven (Paul Scherrer Institute, Lausanne)
Small scale plasticity; in-situ X-ray/neutron diffraction and
computational modelling
E. Estevez Rams (University of Havana)
Diffraction analysis of planar faulting
W.Pantleon (Risoe National Laboratory)
Strain in plastically deformed copper
R. Guinebretiere (Limoges)
Microstructural analysis of epitaxial oxide thin films
M. Birkholz (IHP GmbH - Innovations for High Performance
Microelectronics / Institut für innovative Mikroelektronik)
Texture gradients in thin polycrystalline films
P. Scardi (University of Trento)
Domain size and dislocation broadening in whole pattern modelling
M. Leoni (University of Trento)
Diffraction analysis of layer disorder
E.J. Mittemeijer (MF-MPI, Stuttgart)
The "state of the art" of the diffraction analysis of crystallite size
and lattice strain
A. Leineweber (MPI-MF, Stuttgart)
Analysis of concentration and stress variations in thin films and powders
U. Welzel (MPI-MF, Stuttgart)
Recent instrumental developments for laboratory diffractometers
--
Dr. Andreas Leineweber
Max-Planck-Institut fuer Metallforschung
Heisenbergstrasse 3
70569 Stuttgart
Germany
Tel. +49 711 689 3365
Fax. +49 711 689 3312
e-mail: [EMAIL PROTECTED]
home page of department:
http://www.mf.mpg.de/de/abteilungen/mittemeijer/english/index_english.htm
