¿Sure about the cell parameter?

I was used to

Hubbard  et al (1975)          543.0880(35) pm
or
Siegert & Becker (1984)     543.101988(48) pm

which already differ by 4 esd, ¿but now we would have >19 esd?

Miguel

On 3 Jul 2005 at 3:52, L. Cranswick wrote:

> 
> Is there an "official" table of NIST 640c Silicon cell axes (with ESD)
> for when NIST 640c is not exactly measured at 22.5 °C (say anywhere
> between 5°C to 40°C)
> 
> Using the certificate reference via:
>  https://srmors.nist.gov/view_cert.cfm?srm=640C
>  The certified lattice parameter for a temperature of 22.5 °C is
>        0.54311946 nm ± 0.00000092 nm
> 
> The NIST certificate mentions the thermal expansion coefficient which
> was applied to the measured peaks.  
> 
> For those who like their XRD calibrations and/or wavelengths backed up
> all the way with a bit of NIST Onion Paper, it would be nice to have
> such a table (or the range in which the stated thermal expansion
> coefficient in the certificate (and certificate ESD) is valid). 
> 
> (Some labs have different air-conditioning temperatures / or lack of
> room temperature control).
> 
> Lachlan  
> 
> 
> -- 
> -----------------------
> Lachlan M. D. Cranswick
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> 

-- 
Miguel Gregorkiewitz
Dip Scienze della Terra, Università
via Laterino 8, I-53100 Siena, Europe
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