Dear all:
Recently, I did some refinements with GSAS program to get lattice parameters for some nanomaterials. The data were collected at X17B1 of NSLS with two different distances between image detector and sample. I noticed that the lattice parameters were different with different distances for the same sample. Also, I tried to refine the data with and without asymmetry correction; this also resulted in the different lattice parameters. (I used the same instrumental parameter file for two different distances). I also tried to refine the data collected at other beamlines, the cell parameter was also different. I am a bit confused with all these changes. Any comments from you all will be highly appreciated! Thanks,
Nice day,
Xianqin
Xianqin Wang Brookhaven National Lab Upton, NY, 11973 USA
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