No Subject

["Gustavo A. Cifredo Chacón"]

I have noticed  a systematic Rwp improvement about 1% in my Rietveld
refinements carried out with data our difractometer, as it is included an
aditional phase (I use Aluminium, but works with other) but with very
broadened peaks (those of crystals about 1 cell in size).
Is this improvement due to problems in aligment of the difractometer X-Ray
or it is another kind of artifact?

Thank you very much in advance.
Gustavo A. Cifredo
Universidad de Cadiz
Spain