Is it possible to find a sofware which
is suitable for quantitative analysis of amorphous or nanocrystallized compounds
(especially silica and silicon carbide) ?.
The only one I have now is RIETQUAN from
Luca Lutterotti (http://www.ing.unitn.it/~luttero/)
in which the amorphous silica is simulated by a structure factor of cubic silica
with a grain size chosen to be close to the value of the cell parameter. The
results are in good agreement with compositions found by chemical analysis and
other technics, but perhaps only because there is a mix of crystalline and
amorphous compounds. The crystallines compounds are well estimated then by
difference the amount of amorphous phase is good.
If anybody knows something about
Rietveld method and amorphous compounds, please tell me
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Dr Hervé Brequel
Dipartimento di Chimica
Via Vienna 2
I-07100 Sassari, Italy
Dr Hervé Brequel
Dipartimento di Chimica
Via Vienna 2
I-07100 Sassari, Italy
Tél : (+39)-079-229524
Fax: (+39)-079-212069
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Fax: (+39)-079-212069
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