On Thu, Mar 26, 2026 at 11:26:50AM +0800, Li Wang wrote: > This patchset aims to fix various spurious failures and improve the overall > robustness of the cgroup zswap selftests. > > The primary motivation is to make the tests compatible with architectures > that use non-4K page sizes (such as 64K on ppc64le and arm64). Currently, > the tests rely heavily on hardcoded 4K page sizes and fixed memory limits. > On 64K page size systems, these hardcoded values lead to sub-page granularity > accesses, incorrect page count calculations, and insufficient memory pressure > to trigger zswap writeback, ultimately causing the tests to fail. > > Additionally, this series addresses OOM kills occurring in test_swapin_nozswap > by dynamically scaling memory limits, and prevents spurious test failures > when zswap is built into the kernel but globally disabled. > > Changes in v5: > Patch 1/8: Defined PATH_ZSWAP and PATH_ZSWAP_ENABLED macros. > Patch 4/8: Merge Waiman's work into this patch (use page_size). > Patch 5/8: Change pagesize by the global page_size. > Patch 6/8: Swap data patterns: use getrandom() for wb_group and simple > memset for zw_group to fix the reversed allocation logic. > Patch 7/8: Setting zswap.max to zswap_usage/4 to increase writeback > pressure. > Patch 8/8: New added. Just add loops for read zswpwb more times. > > Test all passed on: > x86_64(4k), aarch64(4K, 64K), ppc64le(64K).
Hi Andrew, All, I see that Sashiko still points out minor issues in this patchset, That seems very tiny in selftest programming. I can correct all that in a new version if you'd like a perfect patchset. Sashiko comments: https://sashiko.dev/#/patchset/20260326032658.96819-1-liwang%40redhat.com -- Regards, Li Wang
