+ /* { dg-final { scan-assembler "bics\tx\[0-9\]+, x\[0-9\]+, x\[0-9\]+" } } */
+ /* { dg-final { scan-assembler "bics\tx\[0-9\]+, x\[0-9\]+,
x\[0-9\]+, lsl 3" } } */
Ian, These two patterns have the same issue Richard just highlighted
on your other patch, ie the first pattern will also match anything
matched by the second pattern.
/Marcus
On 26 April 2013 14:24, Ian Bolton <ian.bol...@arm.com> wrote:
> With these patterns, we can now generate BICS in the appropriate places.
>
> I've included test cases.
>
> This has been run on linux and bare-metal regression tests.
>
> OK to commit?
>
> Cheers,
> Ian
>
>
>
> 2013-04-26 Ian Bolton <ian.bol...@arm.com>
>
> gcc/
> * config/aarch64/aarch64.md (*and_one_cmpl<mode>3_compare0):
> New pattern.
> (*and_one_cmplsi3_compare0_uxtw): Likewise.
> (*and_one_cmpl_<SHIFT:optab><mode>3_compare0): Likewise.
> (*and_one_cmpl_<SHIFT:optab>si3_compare0_uxtw): Likewise.
>
> testsuite/
> * gcc.target/aarch64/bics.c: New test.
> * gcc.target/aarch64/bics2.c: Likewise.
