Re: [PATCH] aarch64: testsuite: fix several duplicate test names

[Andre Vieira]

Hi,

On 01/10/2025 17:23, Richard Earnshaw wrote:

diff --git a/gcc/testsuite/gcc.target/aarch64/declare-simd-2.c 
b/gcc/testsuite/gcc.target/aarch64/declare-simd-2.c
index 2f4d3a866e5..f8ef997db08 100644
--- a/gcc/testsuite/gcc.target/aarch64/declare-simd-2.c
+++ b/gcc/testsuite/gcc.target/aarch64/declare-simd-2.c
@@ -52,10 +52,7 @@ void f05 (short a, short *b, short c)
  }

/* { dg-final { scan-assembler {_ZGVnN4ul2v_f05:} } } */

-/* { dg-final { scan-assembler {_ZGVnN4ul2v_f05:} } } */
-/* { dg-final { scan-assembler {_ZGVnM8ul2v_f05:} } } */
  /* { dg-final { scan-assembler {_ZGVnM8ul2v_f05:} } } */
  #ifdef __cplusplus
  }
  #endif
-

That was a typo (probably my me), can you please change to

 /* { dg-final { scan-assembler {_ZGVnN4ul2v_f05:} } } */
-/* { dg-final { scan-assembler {_ZGVnN4ul2v_f05:} } } */
-/* { dg-final { scan-assembler {_ZGVnM8ul2v_f05:} } } */
+/* { dg-final { scan-assembler {_ZGVnM4ul2v_f05:} } } */
+/* { dg-final { scan-assembler {_ZGVnN8ul2v_f05:} } } */
 /* { dg-final { scan-assembler {_ZGVnM8ul2v_f05:} } } */

So basically we want to check it generated:
64-bit not masked
64-bit masked
128-bit not masked
128-bit masked

Thanks!