On Thu, Sep 28, 2023 at 9:01 PM Bruce Richardson <bruce.richard...@intel.com> wrote: > > By reducing the iterations for the final stage of the self-test, the SW > eventdev tests can be fast enough for consideration in the fast-tests > suite. This enables them to be run as part of the regular patch CI > tests, and therefore increases the chances of catching any errors in > patches that may affect this component. > > Signed-off-by: Bruce Richardson <bruce.richard...@intel.com>
Looks like --to-cmd ./scripts/get_maintainer.pl not used in sending patches. @Van Haaren, Harry Could you review and Ack it to merge? > --- > app/test/test_eventdev.c | 2 +- > drivers/event/sw/sw_evdev_selftest.c | 2 +- > 2 files changed, 2 insertions(+), 2 deletions(-) > > diff --git a/app/test/test_eventdev.c b/app/test/test_eventdev.c > index c51c93bdbd..c94c15bef1 100644 > --- a/app/test/test_eventdev.c > +++ b/app/test/test_eventdev.c > @@ -1259,7 +1259,7 @@ test_eventdev_selftest_cn10k(void) > REGISTER_FAST_TEST(eventdev_common_autotest, true, true, > test_eventdev_common); > > #ifndef RTE_EXEC_ENV_WINDOWS > -REGISTER_DRIVER_TEST(eventdev_selftest_sw, test_eventdev_selftest_sw); > +REGISTER_FAST_TEST(eventdev_selftest_sw, true, true, > test_eventdev_selftest_sw); > REGISTER_DRIVER_TEST(eventdev_selftest_octeontx, > test_eventdev_selftest_octeontx); > REGISTER_TEST_COMMAND(eventdev_selftest_dpaa2, test_eventdev_selftest_dpaa2); > REGISTER_TEST_COMMAND(eventdev_selftest_dlb2, test_eventdev_selftest_dlb2); > diff --git a/drivers/event/sw/sw_evdev_selftest.c > b/drivers/event/sw/sw_evdev_selftest.c > index 3aa8d76ca8..3f0d9806f2 100644 > --- a/drivers/event/sw/sw_evdev_selftest.c > +++ b/drivers/event/sw/sw_evdev_selftest.c > @@ -28,7 +28,7 @@ > > #define MAX_PORTS 16 > #define MAX_QIDS 16 > -#define NUM_PACKETS (1<<18) > +#define NUM_PACKETS (1 << 17) > #define DEQUEUE_DEPTH 128 > > static int evdev; > -- > 2.39.2 >
