By reducing the iterations for the final stage of the self-test, the SW eventdev tests can be fast enough for consideration in the fast-tests suite. This enables them to be run as part of the regular patch CI tests, and therefore increases the chances of catching any errors in patches that may affect this component.
Signed-off-by: Bruce Richardson <bruce.richard...@intel.com> --- app/test/test_eventdev.c | 2 +- drivers/event/sw/sw_evdev_selftest.c | 2 +- 2 files changed, 2 insertions(+), 2 deletions(-) diff --git a/app/test/test_eventdev.c b/app/test/test_eventdev.c index c51c93bdbd..c94c15bef1 100644 --- a/app/test/test_eventdev.c +++ b/app/test/test_eventdev.c @@ -1259,7 +1259,7 @@ test_eventdev_selftest_cn10k(void) REGISTER_FAST_TEST(eventdev_common_autotest, true, true, test_eventdev_common); #ifndef RTE_EXEC_ENV_WINDOWS -REGISTER_DRIVER_TEST(eventdev_selftest_sw, test_eventdev_selftest_sw); +REGISTER_FAST_TEST(eventdev_selftest_sw, true, true, test_eventdev_selftest_sw); REGISTER_DRIVER_TEST(eventdev_selftest_octeontx, test_eventdev_selftest_octeontx); REGISTER_TEST_COMMAND(eventdev_selftest_dpaa2, test_eventdev_selftest_dpaa2); REGISTER_TEST_COMMAND(eventdev_selftest_dlb2, test_eventdev_selftest_dlb2); diff --git a/drivers/event/sw/sw_evdev_selftest.c b/drivers/event/sw/sw_evdev_selftest.c index 3aa8d76ca8..3f0d9806f2 100644 --- a/drivers/event/sw/sw_evdev_selftest.c +++ b/drivers/event/sw/sw_evdev_selftest.c @@ -28,7 +28,7 @@ #define MAX_PORTS 16 #define MAX_QIDS 16 -#define NUM_PACKETS (1<<18) +#define NUM_PACKETS (1 << 17) #define DEQUEUE_DEPTH 128 static int evdev; -- 2.39.2
