W dniu 08.10.2020 o 09:30, David Marchand pisze: > On Thu, Oct 8, 2020 at 7:24 AM Lukasz Wojciechowski > <l.wojciec...@partner.samsung.com> wrote: >> During review and verification of the patch created by Sarosh Arif: >> "test_distributor: prevent memory leakages from the pool" I found out >> that running distributor unit tests multiple times in a row causes fails. >> So I investigated all the issues I found. >> >> There are few synchronization issues that might cause deadlocks >> or corrupted data. They are fixed with this set of patches for both tests >> and librte_distributor library. >> >> --- >> v5: >> * implement missing functionality in burst mode - worker shutdown >> * fix shutdown test to always shutdown busy worker >> * use atomic stores instead of barrier in tests clear_packet_count() >> * reorder patches >> * new patch 7: fix call to return_pkt in single mode >> * new patch 11: replacing delays with spinlock on atomics in tests >> * new patch 12: fix scalar matching algorithm >> * new patch 13: new test with marking and checking every packet >> * new patch 14: flush also in flight packets >> * new patch 15: fix clearing returns buffer >> * minor fixes in other patches > Thanks for working on it, Lukasz. Sorry for the delay, but it was much to solve and test. > David, Honnappa, review please. I'm here if you have any questions or suggestions > > -- Lukasz Wojciechowski Principal Software Engineer
Samsung R&D Institute Poland Samsung Electronics Office +48 22 377 88 25 l.wojciec...@partner.samsung.com
