On Thu, Oct 8, 2020 at 7:24 AM Lukasz Wojciechowski <l.wojciec...@partner.samsung.com> wrote: > > During review and verification of the patch created by Sarosh Arif: > "test_distributor: prevent memory leakages from the pool" I found out > that running distributor unit tests multiple times in a row causes fails. > So I investigated all the issues I found. > > There are few synchronization issues that might cause deadlocks > or corrupted data. They are fixed with this set of patches for both tests > and librte_distributor library. > > --- > v5: > * implement missing functionality in burst mode - worker shutdown > * fix shutdown test to always shutdown busy worker > * use atomic stores instead of barrier in tests clear_packet_count() > * reorder patches > * new patch 7: fix call to return_pkt in single mode > * new patch 11: replacing delays with spinlock on atomics in tests > * new patch 12: fix scalar matching algorithm > * new patch 13: new test with marking and checking every packet > * new patch 14: flush also in flight packets > * new patch 15: fix clearing returns buffer > * minor fixes in other patches
Thanks for working on it, Lukasz. David, Honnappa, review please. -- David Marchand
