On Fri, Oct 18, 2019 at 10:31 PM David Christensen
<d...@linux.vnet.ibm.com> wrote:
>
> The test works by creating a token comprised of random data
> and a CRC8 value, using the rte_atomicXX_exchange to exchange
> the new token for a previously generated token, and then
> verifying that the exchanged data is intact (i.e. the CRC8
> is still correct for the data).
Thanks, can you rebase this on master?
>
> Signed-off-by: David Christensen <d...@linux.vnet.ibm.com>
> ---
> v4:
> * Fix build error due to use of variable initialization
> in "for" statement.
>
> v3:
> * Actually fixed build issue on all platforms caused by
> misspelling of rte_atomic64_inc
>
> v2:
> * Fixed build issue on all platforms caused by misspelling
> of rte_atomic64_inc
>
> app/test/test_atomic.c | 176 ++++++++++++++++++++++++++++++++++++++++-
> 1 file changed, 174 insertions(+), 2 deletions(-)
>
> diff --git a/app/test/test_atomic.c b/app/test/test_atomic.c
> index 43be30ec0..858c6d7f9 100644
> --- a/app/test/test_atomic.c
> +++ b/app/test/test_atomic.c
> @@ -1,10 +1,12 @@
> /* SPDX-License-Identifier: BSD-3-Clause
> * Copyright(c) 2010-2014 Intel Corporation
> + * Copyright(c) 2019 Arm Limited
> */
>
> #include <stdio.h>
> #include <stdint.h>
> #include <unistd.h>
> +#include <inttypes.h>
> #include <sys/queue.h>
>
> #include <rte_memory.h>
> @@ -13,6 +15,8 @@
> #include <rte_atomic.h>
> #include <rte_eal.h>
> #include <rte_lcore.h>
> +#include <rte_random.h>
> +#include <rte_hash_crc.h>
>
> #include "test.h"
>
> @@ -20,7 +24,7 @@
> * Atomic Variables
> * ================
> *
> - * - The main test function performs three subtests. The first test
> + * - The main test function performs four subtests. The first test
Let's drop this sentence.
No point in maintaining the number of subtests.
> * checks that the usual inc/dec/add/sub functions are working
> * correctly:
> *
> @@ -61,11 +65,26 @@
> * atomic_sub(&count, tmp+1);
> *
> * - At the end of the test, the *count* value must be 0.
> + *
> + * - Test "atomic exchange"
> + *
> + * - Create a 64 bit token that can be tested for data integrity
> + *
> + * - Invoke ``test_atomic_exchange`` on each lcore. Before doing
> + * anything else, the cores wait for a synchronization event.
> + * Each core then does the follwoing for N iterations:
> + *
> + * Generate a new token with a data integrity check
> + * Exchange the new token for previously generated token
> + * Increment a counter if a corrupt token was received
> + *
> + * - At the end of the test, the number of corrupted tokens must be 0.
> + *
> */
>
> #define NUM_ATOMIC_TYPES 3
>
> -#define N 10000
> +#define N 1000000
>
> static rte_atomic16_t a16;
> static rte_atomic32_t a32;
> @@ -216,6 +235,127 @@ test_atomic_dec_and_test(__attribute__((unused)) void
> *arg)
> return 0;
> }
>
> +/*
> + * Helper definitions/variables/functions for
> + * atomic exchange tests
> + */
> +typedef union {
> + uint16_t u16;
> + uint8_t u8[2];
> +} rte_u16_t;
> +
> +typedef union {
> + uint32_t u32;
> + uint16_t u16[2];
> + uint8_t u8[4];
> +} rte_u32_t;
> +
> +typedef union {
> + uint64_t u64;
> + uint32_t u32[2];
> + uint16_t u16[4];
> + uint8_t u8[8];
> +} rte_u64_t;
Please, don't use such names for internal types.
It gives the impression those are EAL types.. but I don't feel like we
need them, so let's just avoid adding them in EAL, now.
--
David Marchand
