On Fri, 3 Mar 2023 15:08:01 GMT, Jorn Vernee <jver...@openjdk.org> wrote:
> Port of: https://github.com/openjdk/panama-foreign/pull/804 which reduces > duplication in the test code by switching test value generation over to a > common method in `NativeTestHelper`. src/java.base/share/classes/jdk/internal/foreign/Utils.java line 224: > 222: * @param elements the structs' fields > 223: */ > 224: public static StructLayout computePaddedStructLayout(MemoryLayout... > elements) { Note that this method is in `Utils` since we will also need it later for the fallback linker. ------------- PR: https://git.openjdk.org/jdk/pull/12856
