Dear All,
Is there a way to get XDS to include reflections in the far corners
of diffraction images.
XDS seems to take the high-resolution limit automatically from the
edge of the images corresponding to the smallest radius from the
center. In my case, with the keyword set to
"INCLUDE_RESOLUTION_RANGE=50 0.0" it does not appear to include all
reflections (those higher than 1.80 A resolution), although there are
reflections to 1.60 A resolution in the corner of the diffraction
images. I would like to include these reflections in the integration
and processing. (Diffraction data was collected on a ADSC Quantum
Q315r detector).
Maybe I am missing something obvious.
Thank you very much for any comments.
Florian
