After some more investigation, here are the main points that make this issue a 
tricky one to debug:
1. The test failure is not isolated. While the uicheck-sw test is the culprit, 
it is just an umbrella for many other tests. And it's those smaller tests that 
the failure occurs all over. This makes it hard to just "fix the tests".
2. I have not been able to reproduce this locally on a rpi4. Laney pointed out 
that perhaps having multiple containers running the same test might generate 
the load needed (assuming that plays a key role in the failures seen on LP) and 
I'll certainly give this a shot.
3. Currently if you look at the recent hirsute armhf and arm64 LO test results, 
you'll see that the rate of failure is way down (about 1/10 times). But just a 
couple of weeks ago the failure rate was much higher. This suggests that it's 
load on the nodes causing the problem because that's when the infra was quite 
busy.
4. Marking the test simply as "flaky" won't work because it's actually 
autopkgtest killing the process


The approach going forward is to try and be clever about letting this 
uicheck-sw test timeout and not be considered a failure:
https://git.launchpad.net/~hellsworth/+git/libreoffice/commit/?h=ubuntu-hirsute-7.0-workaround-arm-flakiness&id=63170c4e1824dcee45b670738ff47a6174a991a8

A test build on both armhf and arm64 to try out these changes:
https://launchpad.net/~hellsworth/+archive/ubuntu/lo-arm-flaky-testing

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https://bugs.launchpad.net/bugs/1785262

Title:
  arm64 autopkgtests are flaky

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