smartctl 6.5 2016-05-07 r4318 [i386-pc-solaris2.11] (local build)

Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org

 

=== START OF INFORMATION SECTION ===

Device Model:     SAMSUNG MMCRE64G5MXP-0VB

Firmware Version: VBM1901Q

User Capacity:    64,023,257,088 bytes [64.0 GB]

Sector Size:      512 bytes logical/physical

Rotation Rate:    Solid State Device

Device is:        Not in smartctl database [for details use: -P showall]

ATA Version is:   ATA/ATAPI-7 T13/1532D revision 1

Local Time is:    Sat May 20 17:05:55 2017 CEST

SMART support is: Available - device has SMART capability.

SMART support is: Enabled

AAM feature is:   Disabled

APM feature is:   Unavailable

Rd look-ahead is: Enabled

Write cache is:   Enabled

ATA Security is:  Disabled, NOT FROZEN [SEC1]

Wt Cache Reorder: Unavailable

 

Read SMART Data failed: scsi error aborted command

 

=== START OF READ SMART DATA SECTION ===

SMART Status command failed: scsi error aborted command

SMART overall-health self-assessment test result: UNKNOWN!

SMART Status, Attributes and Thresholds cannot be read.

 

Read SMART Log Directory failed: scsi error aborted command

 

General Purpose Log Directory Version 1

Address    Access  R/W   Size  Description

0x00       GPL     R/O      1  Log Directory

0x01       GPL     R/O      1  Summary SMART error log

0x02       GPL     R/O      1  Comprehensive SMART error log

0x03       GPL     R/O      1  Ext. Comprehensive SMART error log

0x06       GPL     R/O      1  SMART self-test log

0x07       GPL     R/O      1  Extended self-test log

0x09       GPL     R/W      1  Selective self-test log

0x10       GPL     R/O      1  SATA NCQ Queued Error log

0x11       GPL     R/O      1  SATA Phy Event Counters log

0x80-0x9f  GPL     R/W      1  Host vendor specific log

 

Warning! SMART Extended Comprehensive Error Log Structure error: invalid
SMART checksum.

SMART Extended Comprehensive Error Log Version: 1 (1 sectors)

Device Error Count: 2

               CR     = Command Register

               FEATR  = Features Register

               COUNT  = Count (was: Sector Count) Register

               LBA_48 = Upper bytes of LBA High/Mid/Low Registers ]  ATA-8

               LH     = LBA High (was: Cylinder High) Register    ]   LBA

               LM     = LBA Mid (was: Cylinder Low) Register      ] Register

               LL     = LBA Low (was: Sector Number) Register     ]

               DV     = Device (was: Device/Head) Register

               DC     = Device Control Register

               ER     = Error register

               ST     = Status register

Powered_Up_Time is measured from power on, and printed as

DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,

SS=sec, and sss=millisec. It "wraps" after 49.710 days.

 

Error 2 [1] occurred at disk power-on lifetime: 654 hours (27 days + 6
hours)

  When the command that caused the error occurred, the device was active or
idle.

 

  After command completion occurred, registers were:

  ER -- ST COUNT  LBA_48  LH LM LL DV DC

  -- -- -- == -- == == == -- -- -- -- --

  10 -- 51 00 20 00 00 07 74 0a ac 40 00  Error: IDNF 32 sectors at LBA =
0x07740aac = 125045420

 

  Commands leading to the command that caused the error were:

  CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time
Command/Feature_Name

  -- == -- == -- == == == -- -- -- -- --  ---------------
--------------------

  25 03 03 00 20 00 00 07 74 0a ac 40 00     00:04:09.000  READ DMA EXT

  25 03 03 00 01 00 00 07 74 0a af 40 00     00:04:09.000  READ DMA EXT

  25 03 03 00 01 00 00 00 00 00 01 40 00     00:04:09.000  READ DMA EXT

  25 03 03 00 01 00 00 00 00 00 00 40 00     00:04:09.000  READ DMA EXT

  35 03 03 00 20 00 00 07 74 06 9f 40 00     00:04:09.000  WRITE DMA EXT

 

Error 1 [0] occurred at disk power-on lifetime: 654 hours (27 days + 6
hours)

  When the command that caused the error occurred, the device was active or
idle.

 

  After command completion occurred, registers were:

  ER -- ST COUNT  LBA_48  LH LM LL DV DC

  -- -- -- == -- == == == -- -- -- -- --

  10 -- 51 00 20 00 00 07 74 0a ac 40 00  Error: IDNF 32 sectors at LBA =
0x07740aac = 125045420

 

  Commands leading to the command that caused the error were:

  CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time
Command/Feature_Name

  -- == -- == -- == == == -- -- -- -- --  ---------------
--------------------

  25 03 03 00 20 00 00 07 74 0a ac 40 00     00:04:09.000  READ DMA EXT

  25 03 03 00 01 00 00 07 74 0a af 40 00     00:04:09.000  READ DMA EXT

  25 03 03 00 01 00 00 00 00 00 01 40 00     00:04:09.000  READ DMA EXT

  25 03 03 00 01 00 00 00 00 00 00 40 00     00:04:09.000  READ DMA EXT

  35 03 03 00 21 00 00 00 00 00 01 40 00     00:04:09.000  WRITE DMA EXT

 

Warning! SMART Extended Self-test Log Structure error: invalid SMART
checksum.

SMART Extended Self-test Log Version: 1 (1 sectors)

Num  Test_Description    Status                  Remaining  LifeTime(hours)
LBA_of_first_error

# 1  Short offline       Completed without error       00%     25968
-

# 2  Short offline       Completed without error       00%     25941
-

# 3  Short offline       Completed without error       00%     25917
-

# 4  Short offline       Completed without error       00%     25893
-

# 5  Short offline       Completed without error       00%     25869
-

# 6  Short offline       Completed without error       00%     25845
-

# 7  Short offline       Completed without error       00%     25821
-

# 8  Short offline       Completed without error       00%     25795
-

# 9  Short offline       Completed without error       00%     25771
-

#10  Short offline       Completed without error       00%     25747
-

#11  Short offline       Completed without error       00%     25734
-

#12  Short offline       Completed without error       00%     25710
-

#13  Short offline       Completed without error       00%     25686
-

#14  Short offline       Completed without error       00%     25666
-

#15  Short offline       Completed without error       00%     25652
-

#16  Short offline       Completed without error       00%     25628
-

#17  Short offline       Completed without error       00%     25611
-

#18  Short offline       Completed without error       00%     25594
-

#19  Short offline       Completed without error       00%     25593
-

 

Selective Self-tests/Logging not supported

 

SCT Commands not supported

 

Device Statistics (GP/SMART Log 0x04) not supported

 

SATA Phy Event Counters (GP Log 0x11)

ID      Size     Value  Description

0x0001  2            0  Command failed due to ICRC error

0x0002  2            0  R_ERR response for data FIS

0x0003  2            0  R_ERR response for device-to-host data FIS

0x0004  2            0  R_ERR response for host-to-device data FIS

0x0005  2            0  R_ERR response for non-data FIS

0x0006  2            0  R_ERR response for device-to-host non-data FIS

0x0007  2            0  R_ERR response for host-to-device non-data FIS

0x0008  2            0  Device-to-host non-data FIS retries

0x0009  2            4  Transition from drive PhyRdy to drive PhyNRdy

0x000a  2            4  Device-to-host register FISes sent due to a COMRESET

0x000b  2            0  CRC errors within host-to-device FIS

0x000d  2            0  Non-CRC errors within host-to-device FIS

0x000f  2            0  R_ERR response for host-to-device data FIS, CRC

0x0010  2            0  R_ERR response for host-to-device data FIS, non-CRC

0x0012  2            0  R_ERR response for host-to-device non-data FIS, CRC

0x0013  2            0  R_ERR response for host-to-device non-data FIS,
non-CRC

 

smartctl 6.5 2016-05-07 r4318 [i386-pc-solaris2.11] (local build)

Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org

 

=== START OF INFORMATION SECTION ===

Device Model:     SAMSUNG MMCRE64G5MXP-0VB

Firmware Version: VBM1901Q

User Capacity:    64,023,257,088 bytes [64.0 GB]

Sector Size:      512 bytes logical/physical

Rotation Rate:    Solid State Device

Device is:        Not in smartctl database [for details use: -P showall]

ATA Version is:   ATA/ATAPI-7 T13/1532D revision 1

Local Time is:    Sat May 20 17:06:10 2017 CEST

SMART support is: Available - device has SMART capability.

SMART support is: Enabled

 

=== START OF READ SMART DATA SECTION ===

SMART overall-health self-assessment test result: PASSED

 

General SMART Values:

Offline data collection status:  (0x02)      Offline data collection
activity

 
was completed without error.

 
Auto Offline Data Collection: Disabled.

Self-test execution status:      (   0)           The previous self-test
routine completed

 
without error or no self-test has ever 

 
been run.

Total time to complete Offline 

data collection:                              (  240) seconds.

Offline data collection

capabilities:                                      (0x53) SMART execute
Offline immediate.

 
Auto Offline data collection on/off support.

 
Suspend Offline collection upon new

 
command.

                                                                          No
Offline surface scan supported.

 
Self-test supported.

                                                                          No
Conveyance Self-test supported.

 
Selective Self-test supported.

SMART capabilities:            (0x0003)         Saves SMART data before
entering

 
power-saving mode.

 
Supports SMART auto save timer.

Error logging capability:        (0x01)          Error logging supported.

 
General Purpose Logging supported.

Short self-test routine 

recommended polling time:        (   4) minutes.

Extended self-test routine

recommended polling time:        (  16) minutes.

 

SMART Attributes Data Structure revision number: 1

Vendor Specific SMART Attributes with Thresholds:

ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED
WHEN_FAILED RAW_VALUE

  9 Power_On_Hours          0x0032   094   094   000    Old_age   Always
-       25969

12 Power_Cycle_Count       0x0032   099   099   000    Old_age   Always
-       249

175 Program_Fail_Count_Chip 0x0032   100   100   010    Old_age   Always
-       0

176 Erase_Fail_Count_Chip   0x0032   100   100   010    Old_age   Always
-       0

177 Wear_Leveling_Count     0x0013   099   099   017    Pre-fail  Always
-       2

178 Used_Rsvd_Blk_Cnt_Chip  0x0013   090   090   010    Pre-fail  Always
-       6

179 Used_Rsvd_Blk_Cnt_Tot   0x0013   098   098   010    Pre-fail  Always
-       20

180 Unused_Rsvd_Blk_Cnt_Tot 0x0013   098   098   010    Pre-fail  Always
-       1900

181 Program_Fail_Cnt_Total  0x0032   100   100   010    Old_age   Always
-       0

182 Erase_Fail_Count_Total  0x0032   100   100   010    Old_age   Always
-       0

183 Runtime_Bad_Block       0x0013   100   100   010    Pre-fail  Always
-       0

187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always
-       0

195 Hardware_ECC_Recovered  0x001a   200   200   000    Old_age   Always
-       0

198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline
-       0

199 UDMA_CRC_Error_Count    0x003e   253   253   000    Old_age   Always
-       0

232 Available_Reservd_Space 0x0013   090   090   010    Pre-fail  Always
-       54

233 Media_Wearout_Indicator 0x0032   068   068   000    Old_age   Always
-       1353413619

 

SMART Error Log Version: 1

No Errors Logged

 

SMART Self-test log structure revision number 1

Num  Test_Description    Status                  Remaining  LifeTime(hours)
LBA_of_first_error

# 1  Short offline       Completed without error       00%     25968
-

# 2  Short offline       Completed without error       00%     25941
-

# 3  Short offline       Completed without error       00%     25917
-

# 4  Short offline       Completed without error       00%     25893
-

# 5  Short offline       Completed without error       00%     25869
-

# 6  Short offline       Completed without error       00%     25845
-

# 7  Short offline       Completed without error       00%     25821
-

# 8  Short offline       Completed without error       00%     25795
-

# 9  Short offline       Completed without error       00%     25771
-

#10  Short offline       Completed without error       00%     25747
-

#11  Short offline       Completed without error       00%     25734
-

#12  Short offline       Completed without error       00%     25710
-

#13  Short offline       Completed without error       00%     25686
-

#14  Short offline       Completed without error       00%     25666
-

#15  Short offline       Completed without error       00%     25652
-

#16  Short offline       Completed without error       00%     25628
-

#17  Short offline       Completed without error       00%     25611
-

#18  Short offline       Completed without error       00%     25594
-

#19  Short offline       Completed without error       00%     25593
-

#20  Short offline       Completed without error       00%     25569
-

#21  Short offline       Completed without error       00%     25550
-

 

SMART Selective self-test log data structure revision number 1

SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS

    1        0        0  Not_testing

    2        0        0  Not_testing

    3        0        0  Not_testing

    4        0        0  Not_testing

    5        0        0  Not_testing

Selective self-test flags (0x0):

  After scanning selected spans, do NOT read-scan remainder of disk.

If Selective self-test is pending on power-up, resume after 0 minute delay.

 

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