Hi,
attached is the required output for Samsung SSD 840 EVO 256GB, which is
not yet in the database
Rgds
mk
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.10.0-86.el7.x86_64] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Samsung SSD 840 EVO 250GB
Serial Number: S1DBNSAD989079N
LU WWN Device Id: 5 002538 8a0030ca9
Firmware Version: EXT0BB0Q
User Capacity: 250.059.350.016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Sun Feb 23 11:46:10 2014 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Disabled
ATA Security is: Disabled, NOT FROZEN [SEC1]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: N/A
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4800) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 1129
12 Power_Cycle_Count -O--CK 099 099 000 - 122
177 Wear_Leveling_Count PO--C- 099 099 000 - 1
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 075 055 000 - 25
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
235 Unknown_Attribute -O--C- 099 099 000 - 22
241 Total_LBAs_Written -O--CK 099 099 000 - 708446608
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 16 Device vendor specific log
0xce GPL,SL VS 16 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Short offline Completed without error 00% 13 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
SCT Support Level: 1
Device State: Active (0)
Current Temperature: 25 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/6760
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (80)
Index Estimated Time Temperature Celsius
81 2014-02-22 14:30 ? -
... ..( 46 skipped). .. -
0 2014-02-22 22:20 ? -
1 2014-02-22 22:30 21 **
2 2014-02-22 22:40 21 **
3 2014-02-22 22:50 22 ***
... ..( 7 skipped). .. ***
11 2014-02-23 00:10 22 ***
12 2014-02-23 00:20 21 **
13 2014-02-23 00:30 21 **
14 2014-02-23 00:40 22 ***
15 2014-02-23 00:50 22 ***
16 2014-02-23 01:00 23 ****
17 2014-02-23 01:10 23 ****
18 2014-02-23 01:20 21 **
... ..( 13 skipped). .. **
32 2014-02-23 03:40 21 **
33 2014-02-23 03:50 23 ****
34 2014-02-23 04:00 21 **
... ..( 6 skipped). .. **
41 2014-02-23 05:10 21 **
42 2014-02-23 05:20 23 ****
43 2014-02-23 05:30 21 **
... ..( 4 skipped). .. **
48 2014-02-23 06:20 21 **
49 2014-02-23 06:30 22 ***
50 2014-02-23 06:40 21 **
... ..( 2 skipped). .. **
53 2014-02-23 07:10 21 **
54 2014-02-23 07:20 24 *****
55 2014-02-23 07:30 21 **
56 2014-02-23 07:40 21 **
57 2014-02-23 07:50 21 **
58 2014-02-23 08:00 24 *****
59 2014-02-23 08:10 21 **
60 2014-02-23 08:20 21 **
61 2014-02-23 08:30 24 *****
62 2014-02-23 08:40 22 ***
63 2014-02-23 08:50 22 ***
64 2014-02-23 09:00 24 *****
65 2014-02-23 09:10 21 **
66 2014-02-23 09:20 24 *****
67 2014-02-23 09:30 24 *****
68 2014-02-23 09:40 24 *****
69 2014-02-23 09:50 25 ******
... ..( 10 skipped). .. ******
80 2014-02-23 11:40 25 ******
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 6 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 6 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
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