e
of materials", Springer-Verlag, pp.187--227;
WA5 Armstrong et al. (2004c), http://www.aip.org.au/wagga2004/.
Regards,Nicholas
Dr Nicholas Armstrong
Department of Applied Physics
University of Technology Sydney
PO Box 123
Broadway NSW 2007
Ph: (+61-2) 9514-2203
Fax: (+61-2) 9514-2219
E-ma
Hi,
At the moment there is development of a NIST Nanocrystallite Size Standard
Reference Material (SRM1979).
Jim Cline and I are working on this SRM. It will include two materials:
(1) CeO2 with spherical crystallite shape and size distribution in the ~20nm
size range (isotropic shape);
(2) ZnO
Hi All.
Regarding the RR ceria. The analysis carried out by us and discussed in
Armstrong et al (2004a,b) did not assume a lognormal distribution, but tested
the distribution model. The results from the Bayesian/MaxEnt methods, were free
of any distribution function. Additional analysis showed t
file which depended on
the characteristics/density of the dislocations.
Best approach is to develop physical models for the line profile broadening and
test them for their plausibility i.e. model selection.
Good luck.
Best Regards, Nick
Dr Nicholas Armstrong
NI
probability was
selected. This approach takes into account the assumptions of each model,
parameters, uncertainties, instrumental and noise effects etc. See Sivia
(1996)Data Analysis: A Bayesian Tutorial (Oxford Science Publications).
Best wishes,
Nick
Dr Nicholas Armstrong
ounding information.
Moreover, it doesn't account for the underlying physics/mathematics, that the
probability distributions/line profiles are positive & additive distributions
(Skilling 1990; Sivia 1996).
Best wishes, Nick
Dr Nicholas Armstrong
ie.
uniform proir) and doesn't always take into consideration the surrounding
information. Moreover, it doesn't account for the underlying
physics/mathematics, that the probability distributions/line profiles are
positive & additive distributions (Skilling 1990; Sivia 1996).
Best wishes, Nick
fs...). With a
least squares approach this is not always the case.
Best Regards, Nick
ps. I agree, it is inappropriate to use the email group to request Journal
articles.
Dr Nicholas Armstrong
NIST-UTS Research Fellow
***
Hi
If you have to use these techniques, the integral breadths are the one to use
-- as Pam pointed out. Also keep in mind that the integral breadth produces a
volume-weighted dimension. This is an apparent measure of the crystallite size
parallel to the diffraction vector, and must be related t
; patterns, what does the G(r) show? Is it just the sum of two
>> individual G(r)s or some mangled convolution between the two?
>
>
--
Dr Nicholas Armstrong
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