At 13:25 29.01.99 +0100, you wrote:
>Dear all
>
>I am working with a Philips PW-1800 diffractometer and I want to do
>Rietveld's refinament by BGMN code.
>
>I need some variables of it; as goniometer radius, height and width
>of the X-ray tube´s focus, radius and width of the horiz
At 13:25 29.01.99 +0100, Angel Luis wrote:
>Dear all
>
>I am working with a Philips PW-1800 diffractometer and I want to do
>Rietveld's refinament by BGMN code.
>
>I need some variables of it; as goniometer radius, height and width
>of the X-ray tube´s focus, radius and width of th
At 15:04 28.04.99 +0200, you wrote:
>We would like to use the variable slit attached with our diffractometer for
>Rietveld refinement. I have read the basic papers on the subject : Modern
>Powder Diffraction + the paper by M.E.Bowden et al « Comparison of
>intensities from fixed and variable div
At 16:08 27.09.99 +0200, Luca Lutterotti wrote:
>If the anisotropic broadening is due to crystallite and/or microstrain
>and/or planar faulting there are Rietveld programs that allows anisotropic
>broadening. The first work on that was again due to Armel Le Bail (anything
>seem to go around him) (
