Thanks Tony
When I add the absorption edge correction to the silicon nitride model (and
add beta-silicon nitride), it becomes -2.8 wt% amorphous; up a little due
to the added correction and down a little due to the extra phase.
If I change your al-SN thermals from 1 to those given in ICSD 77811,
Maybe a silly question: are you assuming you have the data on an absolute scale
in order to do these calculations? Do things like surface roughness somehow not
matter?
Best
Jon
On 13/04/2022 11:56, Matthew Rowles wrote:
Thanks Tony
When I add the absorption edge correction to the silicon
Dear Jon,
It might be just me, my current QPA practise is to micronise all samples down
to 10-40 micron range and make a flat sample surface for the machine to scan.
I trust the SRMs are already fine enough and Matthrew packed them well.
There are roughness correction models but they may be sam
