Directly the distributions (both) using Fourier Transform (an FFT).
Sufficiently fast, implementing it the correct way.
Luca
On Nov 24, 2004, at 12:14, Leonid Solovyov wrote:
actually I implemented the size and strain distributions (both) in my
Rietveld code (Maud) and I demoed it
>actually I implemented the size and strain distributions (both) in my
>Rietveld code (Maud) and I demoed it in Praha beginning of September
Good news! I look forward to see the program. Which profile function do
you use for size distribution analysis? Hopefully not TCH
pseudo-Voigt...
Regards,
> actually I implemented the size and strain distributions (both) in my
> Rietveld code (Maud) and I demoed it in Praha beginning of September.
Thanks Luca,
I'm very, very happy to hear that. Really you are moving very fast!
I was prepared to come in Prague but, unfortunately, I had to cancel on
True Nick,
actually I implemented the size and strain distributions (both) in my
Rietveld code (Maud) and I demoed it in Praha beginning of September.
Actually the program was not released and it is still under testing
because I changed also the interface and other parts that needed more
work;
> gamma, or whatever we assume it to be. On the former, it is easy to see if
> observed profiles can't be successfully fit ("super-Lorentzian" peak
shapes,
> for instance), which means that the TCH peak shape cannot be used.
However,
> an assumption that physically broadened profiles (size and str
Thank you, Davor!
Despite several HOWEVERs in your message it clarifies the situation.
Best wishes,
Leonid
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Yes, one can determine size distribution parameters by using Rietveld
refinement. In particular, the lognormal size distribution is defined by two
parameters (say, the average radius and the distribution dispersion, see,
for instance, (2) and (3) of JAC 37 (2004) 911, SSRR for short here, or
other
