Payzant, E. Andrew
Sent: Wednesday, June 15, 2016 6:25 AM
To: rietveld_l@ill.fr; Peng, Jin
Subject: Re: 答复: Le bail and rietveld method
Probably the sample height has shifted due to thermal contraction. Not likely a
zero shift.
Andrew
_
From: Peng, Jin mailto:jpe
Probably the sample height has shifted due to thermal contraction. Not likely a
zero shift.
Andrew
From: Peng, Jin
Date: June 14, 2016 at 7:55:29 PM EDT
To: rietveld_l@ill.fr
Subject: 答复: Le bail and rietveld method
Low temperature x-ray diffraction on Powder