Hi Zach,
Please do not resend after only one week. Reviewing this series was on
my TODO list ;).
On Thu, 27 Oct 2016 14:13:59 -0500
Zach Brown wrote:
> For ONFI-compliant NAND devices, the ONFI parameters report the maximum number
> of bad blocks per LUN that will be encountered over the lifeti
For ONFI-compliant NAND devices, the ONFI parameters report the maximum number
of bad blocks per LUN that will be encountered over the lifetime of the device,
so we can use that information to get a more accurate (and smaller) value for
the UBI bad PEB limit.
The ONFI parameter "maxiumum number of
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