On Tue, 1 Nov 2016 13:16:25 -0500
Zach Brown wrote:
> For ONFI-compliant NAND devices, the ONFI parameters report the maximum number
> of bad blocks per LUN that will be encountered over the lifetime of the
> device,
> so we can use that information to get a more accurate (and smaller) value for
For ONFI-compliant NAND devices, the ONFI parameters report the maximum number
of bad blocks per LUN that will be encountered over the lifetime of the device,
so we can use that information to get a more accurate (and smaller) value for
the UBI bad PEB limit.
The ONFI parameter "maxiumum number of
2 matches
Mail list logo
