Re: [PATCH] i2c: rk3x: fix bug that cause measured high_ns doesn't meet I2C spec

2014-12-02 Thread Doug Anderson
Addy, On Thu, Nov 6, 2014 at 12:11 AM, Addy Ke wrote: > high_ns calculated from the low division of CLKDIV register is the sum of > actual measured high_ns and rise_ns. The rise time which related to > external pull-up resistor can be up to the maximum rise time in I2C spec. > > In my test, if ex

[PATCH] i2c: rk3x: fix bug that cause measured high_ns doesn't meet I2C spec

2014-11-06 Thread Addy Ke
high_ns calculated from the low division of CLKDIV register is the sum of actual measured high_ns and rise_ns. The rise time which related to external pull-up resistor can be up to the maximum rise time in I2C spec. In my test, if external pull-up resistor is 4.7K, rise_ns is about 700ns. So the a