Jonathan Cameron wrote:
> On Fri, 16 Aug 2024 09:44:32 -0500
> Ira Weiny wrote:
>
> > The test event logs were created as static arrays as an easy way to mock
> > events. Dynamic Capacity Device (DCD) test support requires events be
> > generated dynamically when extents are created or destroyed
On Fri, 16 Aug 2024 09:44:32 -0500
Ira Weiny wrote:
> The test event logs were created as static arrays as an easy way to mock
> events. Dynamic Capacity Device (DCD) test support requires events be
> generated dynamically when extents are created or destroyed.
>
> Modify the event log storage
On 8/16/24 7:44 AM, Ira Weiny wrote:
> The test event logs were created as static arrays as an easy way to mock
> events. Dynamic Capacity Device (DCD) test support requires events be
> generated dynamically when extents are created or destroyed.
>
> Modify the event log storage to be dynamica
The test event logs were created as static arrays as an easy way to mock
events. Dynamic Capacity Device (DCD) test support requires events be
generated dynamically when extents are created or destroyed.
Modify the event log storage to be dynamically allocated. Reuse the
static event data to cre
