Re: [PATCH v3 25/25] tools/testing/cxl: Add DC Regions to mock mem data

2024-09-09 Thread Ira Weiny
Jonathan Cameron wrote: > On Fri, 16 Aug 2024 09:44:33 -0500 > Ira Weiny wrote: > > > cxl_test provides a good way to ensure quick smoke and regression > > testing. The complexity of Dynamic Capacity (DC) extent processing as > > well as the complexity of the new sparse DAX regions can mostly be

Re: [PATCH v3 24/25] tools/testing/cxl: Make event logs dynamic

2024-09-09 Thread Ira Weiny
Jonathan Cameron wrote: > On Fri, 16 Aug 2024 09:44:32 -0500 > Ira Weiny wrote: > > > The test event logs were created as static arrays as an easy way to mock > > events. Dynamic Capacity Device (DCD) test support requires events be > > generated dynamically when extents are created or destroyed