On Dec 5, 2014, at 10:24 AM, Ben Pfaff wrote:
> On Wed, Dec 03, 2014 at 01:21:48PM -0800, Jarno Rajahalme wrote:
>> Change a test so that the result will be the same in both
>> little-endian and big-endian systems.
>
> ...by editing the test case so that only one bit differs?
>
>> Reported-by:
On Wed, Dec 03, 2014 at 01:21:48PM -0800, Jarno Rajahalme wrote:
> Change a test so that the result will be the same in both
> little-endian and big-endian systems.
...by editing the test case so that only one bit differs?
> Reported-by: Mijo Safradin
> Signed-off-by: Jarno Rajahalme
Acked-by:
Change a test so that the result will be the same in both
little-endian and big-endian systems.
Reported-by: Mijo Safradin
Signed-off-by: Jarno Rajahalme
---
lib/classifier.c|3 ++-
tests/classifier.at |4 ++--
2 files changed, 4 insertions(+), 3 deletions(-)
diff --git a/lib/class