Re: [ovs-dev] [PATCH] tests/classifier: Make test work in big-endian systems.

2014-12-08 Thread Jarno Rajahalme
On Dec 5, 2014, at 10:24 AM, Ben Pfaff wrote: > On Wed, Dec 03, 2014 at 01:21:48PM -0800, Jarno Rajahalme wrote: >> Change a test so that the result will be the same in both >> little-endian and big-endian systems. > > ...by editing the test case so that only one bit differs? > >> Reported-by:

Re: [ovs-dev] [PATCH] tests/classifier: Make test work in big-endian systems.

2014-12-05 Thread Ben Pfaff
On Wed, Dec 03, 2014 at 01:21:48PM -0800, Jarno Rajahalme wrote: > Change a test so that the result will be the same in both > little-endian and big-endian systems. ...by editing the test case so that only one bit differs? > Reported-by: Mijo Safradin > Signed-off-by: Jarno Rajahalme Acked-by:

[ovs-dev] [PATCH] tests/classifier: Make test work in big-endian systems.

2014-12-03 Thread Jarno Rajahalme
Change a test so that the result will be the same in both little-endian and big-endian systems. Reported-by: Mijo Safradin Signed-off-by: Jarno Rajahalme --- lib/classifier.c|3 ++- tests/classifier.at |4 ++-- 2 files changed, 4 insertions(+), 3 deletions(-) diff --git a/lib/class