Thanks
Kay and Graeme for inputs.
I should, nevertheless, go deeper into this. I should say that,
in my experience, in some cases the effect is small, but in some
others, I would consider significative. I will try to be more
systematic when possibl
Dear Jorge
As a rule of thumb I would always integrate every reflection on the detector
face & only limit the resolution in scaling (*1) - most integration programs
are well behaved when it comes to modelling reflection profiles & integrating
spots which are “invisible”
As to why you observe w
I've also experienced this, but since the improvement is small, I did not pay
much attention, and did not investigate. My hypothesis why this occurs agrees
with yours. Nothing should prevent you to make use of this effect!
best,
Kay
On Mon, 20 Feb 2017 08:24:58 -0300, Jorge Iulek wrote:
>
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Dear all,
I have been noticing, with many datasets, processed the duet
xds/scale, that when one integrates to a resolution limit which
is (a little) higher than the one used for scaling/merging, the
statistics (and here I mean R-symm, R-meas,
