But at some point, getting a "clear map" might not be the goal. If you're in refinement mode, the weak reflections also provide information that your model needs to fit. I find (or /) to be about as useful as
Rmerge (or its relatives). Ron
On Wed, 9 Jun 2010, James Holton wrote:
Frank von
Frank von Delft wrote:
On 09/06/2010 16:49, James Holton wrote:
Operationally, I recommend treating anisotropic data just like
isotropic data. There is nothing wrong with measuring a lot of zeros
(think about systematic absences), other than making irrelevant
statistics like Rmerge higher.
On 09/06/2010 16:49, James Holton wrote:
Operationally, I recommend treating anisotropic data just like
isotropic data. There is nothing wrong with measuring a lot of zeros
(think about systematic absences), other than making irrelevant
statistics like Rmerge higher. One need only glance at t
I vaguely recall an email from Kay Diderich about 3 years ago to this board but
I couldn't find it, describing a neat method of distorting the diffraction
image to meet the ellipsoidal characteristics of the anisotropic diffraction.
But I might be confusion myself, anyhow Kay can you comment on
Frederic VELLIEUX wrote:
Anisotropy in the diffraction pattern could simply be due to the shape of the
crystals. The intensity of diffraction is a function of the volume of
diffracting matter that is hit by the X-ray beam. Think for example of a thin
plate crystal, which you rotate in the X-ra
h.edu>>
An: Marie Lacroix
mailto:lacroix.ma...@rocketmail.com>>
Gesendet: Mittwoch, den 9. Juni 2010, 16:01:56 Uhr
Betreff: Re: AW: AW: [ccp4bb] Anisotropic data and an extremely long c axis
Does this coincide with the direction of better diffraction ?
Jürgen
-
Jürgen Bosch
Johns Hopkins Bloomberg
Dear Marie,
I believe that the first of Fred's explanations can mostly be corrected for by
scaling (and it could partly be overcome by longer exposure times as long as
radiation damage does not kick in).
In your case, where one cell axis is about 10x as long as the other two, Fred's
second explan
Hi
Many years ago I coded up integration using anisotropic resolution
limits for Mosflm - it seemed to work well, but the refinement
programs available at the time really didn't like huge regions of
reciprocal space having no data in them - they preferred to have
measurements there with s
of solvent in
the third direction).
HTH,
Fred.
> Message du 09/06/10 14:33
> De : "Marie Lacroix"
> A : CCP4BB@JISCMAIL.AC.UK
> Copie à :
> Objet : [ccp4bb] Anisotropic data and an extremely long c axis
>
>
>
>
>
> Hi,
>
> I also have a
A first concern with that extreme anisotropy is at the integration and
scaling stages.
Large swaths of your detector are empty of reflections, but they will still
bias the way reference profiles are calculated at integration; while the
lots of reflections with intensities around 0 (but with signifi
Hi,
I also have a question concerning anisotropic data. Collected a data set and
the best crystal gave highly anisotropic diffraction patterns ( 3.7 A - 5.8 A).
So my first question is how to handle these data. I got only experience with
"normal data" using the ccp4 suite. Are there any pro
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