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Hi,
since some days I've been thinking about implementing routines to
utilize the infrared channel supplied by my Nikon LS-2000 scanner for
automatic defect correction. Is someone already working on this?
My ideas for a first shot on this are (with low IR values ("black")
being high defect probability values):
- Identify single defects (pixel clusters):
- Count all pixels above a certain probability threshold automatically
as defects
- Group adjacent defect pixels into defect clusters
- Add pixels adjacent to a cluster that are above a second (lower)
defect probability threshold to the defect cluster
- Join defect clusters that share pixels added in the previous step
- Repair defects by interpolation between "healthy" pixels. Obviously
this is the trickier part of it all.
Comments or ideas are welcome.
Nils
--=20
Nils Philippsen / Berliner Stra=C3=9Fe 39 / D-71229 Leonberg=20
n...@tiptoe.de / nphil...@redhat.com / n...@lisas.de
PGP fingerprint: C4A8 9474 5C4C ADE3 2B8F 656D 47D8 9B65 6951 3011
Ever noticed that common sense isn't really all that common?
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