Laboratorio MDM - INFM Two-Years Post-Doctoral Position in diffraction/reflectivity from thin films. In the frame of a european project Laboratorio MDM-INFM in the frame of the European Project ESQUI http://pecdc.univ-lemans.fr/esqui/esqui.htm is offering a post-doctoral two-years position in X-ray diffractometry/reflectometry of thin films. We require expererience in X-ray diffractometry and/or reflectivity on thin solid films. The person incharged for this project will perform texture and stress/strain measurements of thin films of interest in microelectronics and film thickness measurementes by means of X-ray reflectivity. Details can be found at http://www.infm.it/bandi/bandiattivi/bando345.htm (In italian) Please contact me if you are interested. -- Dr. Sandro Ferrari Research Associate Lab. MDM-INFM Via Olivetti 2, I-20041 Agrate Brianza (Mi) Tel +39-039-6036383 - Fax +39-039-6881175
