Stephen Checkoway <stephen.checko...@oberlin.edu> writes: > On Feb 18, 2019, at 13:08, Markus Armbruster <arm...@redhat.com> wrote: > >> Stephen Checkoway <stephen.checko...@oberlin.edu> writes: >> >>> On Feb 18, 2019, at 08:43, Thomas Huth <th...@redhat.com> wrote: >>> >>>> On 18/02/2019 07.07, Stephen Checkoway wrote: >>>>> Hi all, >>>>> >>>>> I've been working on some improvements to the pflash_cfi02 block device >>>>> (interleaved flash devices similar to pflash_cfi01, multi-sector erase, >>>>> nonuniform sector sizes, and some bug fixes and I'm planning on >>>>> implementing sector erase suspend/resume commands in the near future). >> >> Any chance you could do multiple region support, too? > > Can you point me at the data sheet for a flash chip with multiple region > support? For my purposes, I only need the features I mentioned, but if it's a > simple change, I'll consider it.
I'm not familiar with CFI pflash, but I can operate a search engine. Have a look at page 27 and 56 of https://media.digikey.com/pdf/Data%20Sheets/Intel%20PDFs/28F160C3,320C3,640C3,800C3%20(x16).pdf and tell us whether it's helpful. >>>> QTestState *qts; >>>> qts = qtest_initf(" qemu-system-arm -M musicpal,accel=qtest " >>>> "-drive if=pflash,file=%s,format=raw", filename); >>> >>> If I do that, will it be possible for the test to override the properties >>> set by pflash_cfi02_register? It looks like I should be able to use -global >>> to set properties that aren't set explicitly. >> >> Yes. >> >> Won't work for properties set by pflash_cfi02_register(), though. To >> test the full range of values there, you'd have to make them >> configurable somehow. We currently don't have a good way to do that. >> Please see >> >> Subject: Re: Configuring pflash devices for OVMF firmware >> Message-ID: <87mun8gd2x....@dusky.pond.sub.org> >> https://lists.nongnu.org/archive/html/qemu-devel/2019-02/msg01734.html > > I see. That's too bad. I think a test would be quite welcome even if it only tests what's testable now with reasonable effort.
