From 35f3227677f715b0ec76b583c109e62d262d1f42 Mon Sep 17 00:00:00 2001 From: erthalion <9erthalion6@gmail.com> Date: Tue, 2 Apr 2019 17:49:18 +0200 Subject: [PATCH v12 1/3] Add tests for group by optimization --- src/test/regress/expected/aggregates.out | 232 +++++++++++++++++++++++++++++++ src/test/regress/sql/aggregates.sql | 96 +++++++++++++ 2 files changed, 328 insertions(+) diff --git a/src/test/regress/expected/aggregates.out b/src/test/regress/expected/aggregates.out index 129c1e5075..a20c69469f 100644 --- a/src/test/regress/expected/aggregates.out +++ b/src/test/regress/expected/aggregates.out @@ -2195,6 +2195,238 @@ SELECT balk(hundred) FROM tenk1; (1 row) ROLLBACK; +-- GROUP BY optimization by reorder columns +SELECT + i AS id, + i/2 AS p, + format('%60s', i%2) AS v, + i/4 AS c, + i/8 AS d, + (random() * (10000/8))::int as e --the same as d but no correlation with p + INTO btg +FROM + generate_series(1, 10000) i; +VACUUM btg; +ANALYZE btg; +-- GROUP BY optimization by reorder columns by frequency +SET enable_hashagg=off; +SET max_parallel_workers= 0; +SET max_parallel_workers_per_gather = 0; +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY p, v; + QUERY PLAN +----------------------------- + GroupAggregate + Group Key: p, v + -> Sort + Sort Key: p, v + -> Seq Scan on btg +(5 rows) + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, p; + QUERY PLAN +----------------------------- + GroupAggregate + Group Key: v, p + -> Sort + Sort Key: v, p + -> Seq Scan on btg +(5 rows) + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, p, c; + QUERY PLAN +----------------------------- + GroupAggregate + Group Key: v, p, c + -> Sort + Sort Key: v, p, c + -> Seq Scan on btg +(5 rows) + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, p, c ORDER BY v, p, c; + QUERY PLAN +----------------------------- + GroupAggregate + Group Key: v, p, c + -> Sort + Sort Key: v, p, c + -> Seq Scan on btg +(5 rows) + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, p, d, c; + QUERY PLAN +------------------------------ + GroupAggregate + Group Key: v, p, d, c + -> Sort + Sort Key: v, p, d, c + -> Seq Scan on btg +(5 rows) + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, p, d, c ORDER BY v, p, d ,c; + QUERY PLAN +------------------------------ + GroupAggregate + Group Key: v, p, d, c + -> Sort + Sort Key: v, p, d, c + -> Seq Scan on btg +(5 rows) + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, p, d, c ORDER BY p, v, d ,c; + QUERY PLAN +------------------------------ + GroupAggregate + Group Key: p, v, d, c + -> Sort + Sort Key: p, v, d, c + -> Seq Scan on btg +(5 rows) + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY p, d, e; + QUERY PLAN +----------------------------- + GroupAggregate + Group Key: p, d, e + -> Sort + Sort Key: p, d, e + -> Seq Scan on btg +(5 rows) + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY p, e, d; + QUERY PLAN +----------------------------- + GroupAggregate + Group Key: p, e, d + -> Sort + Sort Key: p, e, d + -> Seq Scan on btg +(5 rows) + +CREATE STATISTICS btg_dep ON d, e, p FROM btg; +ANALYZE btg; +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY p, d, e; + QUERY PLAN +----------------------------- + GroupAggregate + Group Key: p, d, e + -> Sort + Sort Key: p, d, e + -> Seq Scan on btg +(5 rows) + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY p, e, d; + QUERY PLAN +----------------------------- + GroupAggregate + Group Key: p, e, d + -> Sort + Sort Key: p, e, d + -> Seq Scan on btg +(5 rows) + +-- GROUP BY optimization by reorder columns by index scan +CREATE INDEX ON btg(p, v); +SET enable_seqscan=off; +SET enable_bitmapscan=off; +VACUUM btg; +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY p, v; + QUERY PLAN +------------------------------------------------ + GroupAggregate + Group Key: p, v + -> Index Only Scan using btg_p_v_idx on btg +(3 rows) + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY p, v ORDER BY p, v; + QUERY PLAN +------------------------------------------------ + GroupAggregate + Group Key: p, v + -> Index Only Scan using btg_p_v_idx on btg +(3 rows) + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, p; + QUERY PLAN +------------------------------------------------------ + GroupAggregate + Group Key: v, p + -> Sort + Sort Key: v, p + -> Index Only Scan using btg_p_v_idx on btg +(5 rows) + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, p ORDER BY p, v; + QUERY PLAN +------------------------------------------------ + GroupAggregate + Group Key: p, v + -> Index Only Scan using btg_p_v_idx on btg +(3 rows) + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, p, c; + QUERY PLAN +----------------------------- + GroupAggregate + Group Key: v, p, c + -> Sort + Sort Key: v, p, c + -> Seq Scan on btg +(5 rows) + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, p, c ORDER BY p, v; + QUERY PLAN +----------------------------- + GroupAggregate + Group Key: p, v, c + -> Sort + Sort Key: p, v, c + -> Seq Scan on btg +(5 rows) + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, c, p, d; + QUERY PLAN +------------------------------ + GroupAggregate + Group Key: v, c, p, d + -> Sort + Sort Key: v, c, p, d + -> Seq Scan on btg +(5 rows) + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, c, p, d ORDER BY p, v; + QUERY PLAN +------------------------------ + GroupAggregate + Group Key: p, v, c, d + -> Sort + Sort Key: p, v, c, d + -> Seq Scan on btg +(5 rows) + +RESET enable_hashagg; +RESET max_parallel_workers; +RESET max_parallel_workers_per_gather; +RESET enable_seqscan; +RESET enable_bitmapscan; -- test coverage for aggregate combine/serial/deserial functions BEGIN ISOLATION LEVEL REPEATABLE READ; SET parallel_setup_cost = 0; diff --git a/src/test/regress/sql/aggregates.sql b/src/test/regress/sql/aggregates.sql index d4fd657188..ad73254f88 100644 --- a/src/test/regress/sql/aggregates.sql +++ b/src/test/regress/sql/aggregates.sql @@ -952,6 +952,102 @@ SELECT balk(hundred) FROM tenk1; ROLLBACK; +-- GROUP BY optimization by reorder columns + +SELECT + i AS id, + i/2 AS p, + format('%60s', i%2) AS v, + i/4 AS c, + i/8 AS d, + (random() * (10000/8))::int as e --the same as d but no correlation with p + INTO btg +FROM + generate_series(1, 10000) i; + +VACUUM btg; +ANALYZE btg; + +-- GROUP BY optimization by reorder columns by frequency + +SET enable_hashagg=off; +SET max_parallel_workers= 0; +SET max_parallel_workers_per_gather = 0; + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY p, v; + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, p; + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, p, c; + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, p, c ORDER BY v, p, c; + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, p, d, c; + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, p, d, c ORDER BY v, p, d ,c; + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, p, d, c ORDER BY p, v, d ,c; + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY p, d, e; + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY p, e, d; + +CREATE STATISTICS btg_dep ON d, e, p FROM btg; +ANALYZE btg; + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY p, d, e; + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY p, e, d; + + +-- GROUP BY optimization by reorder columns by index scan + +CREATE INDEX ON btg(p, v); +SET enable_seqscan=off; +SET enable_bitmapscan=off; +VACUUM btg; + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY p, v; + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY p, v ORDER BY p, v; + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, p; + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, p ORDER BY p, v; + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, p, c; + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, p, c ORDER BY p, v; + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, c, p, d; + +EXPLAIN (COSTS off) +SELECT count(*) FROM btg GROUP BY v, c, p, d ORDER BY p, v; + +RESET enable_hashagg; +RESET max_parallel_workers; +RESET max_parallel_workers_per_gather; +RESET enable_seqscan; +RESET enable_bitmapscan; + -- test coverage for aggregate combine/serial/deserial functions BEGIN ISOLATION LEVEL REPEATABLE READ; -- 2.16.4