For an uniform exposure, you have the average film density Da, on the full frame. This is the "reference". An ideal film should have Da in each and every point. In the real case, you move the detector and get a Dmax and Dmin along a track. The peak noise would be the higher value between (Dmax-Da) and (Da-Dmin). Report that to Da and you have a ratio. Now the aperture of the detector will influence these values. IIRC there's a "standard" aperture used for measuring RMS.
To continue, you could under/over expose the film and do the same, and see how this is influencing the "noise" (grain).
Any expert in RMS here ?


cheers,
caveman

Bruce Rubenstein wrote:
Lets assume a detector with an electrical out put is being measured (viewed) with an oscilloscope. You will see an irregular wave form that corresponds to the p-p value of the noise (you can derive the RMS value from this). This is the same as looking at the noise floor for a circuit. The S/N ratio comes from comparing the average value of the noise floor to some other value, i.e., 0 dB. You need two different signals, with different average values that you are comparing to be able to use a ratio. Film grain, by itself is just a noise floor.

BR

[EMAIL PROTECTED] wrote:

Signal = ideal (image)
noise = difference between ideal and what's actually recorded

Now let's try an experiment. We expose the film to a uniform source of light. As an average on the whole frame, the "signal" is good, i.e. we got an average level of gray that corresponds to the exposure. Now let's take a smaller aperture - 1mm x 1mm. The recorded signal varies inside this area, due to the presence of grain. Basically that's how they measure RMS - they take a small aperture and measure the variance of signal when they move that aperture along a uniformly exposed area. What I was asking is if this could be expressed as a s/n ratio instead of the classic "RMS" value.

cheers,
caveman









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