https://bugs.kde.org/show_bug.cgi?id=378633
Bug ID: 378633
Summary: k3bdeviceglobalstest fails
Product: k3b
Version: unspecified
Platform: Compiled Sources
OS: Linux
Status: UNCONFIRMED
Severity: normal
Priority: NOR
Component: general
Assignee: k...@kde.org
Reporter: heire...@exherbo.org
CC: mich...@jabster.pl, tr...@kde.org
Target Milestone: ---
Version: 17.03.90
6: Test command:
/var/tmp/paludis/build/app-cdr-k3b-17.03.90/work/build/tests/k3bdeviceglobalstest
6: Test timeout computed to be: 9.99988e+06
6: ********* Start testing of DeviceGlobalsTest *********
6: Config: Using QtTest library 5.8.0, Qt 5.8.0 (x86_64-little_endian-lp64
shared (dynamic) release build; by GCC 6.3.0)
6: PASS : DeviceGlobalsTest::initTestCase()
6: QWARN : DeviceGlobalsTest::testFrom2Byte() Invalid nullptr!
6: PASS : DeviceGlobalsTest::testFrom2Byte()
6: FAIL! : DeviceGlobalsTest::testFrom4Byte() Compared values are not the same
6: Actual (K3b::Device::from4Byte(d)): 3029484
6: Expected ((quint32)0) : 0
6: Loc:
[/var/tmp/paludis/build/app-cdr-k3b-17.03.90/work/k3b-17.03.90/tests/k3bdeviceglobalstest.cpp(33)]
6: PASS : DeviceGlobalsTest::cleanupTestCase()
6: Totals: 3 passed, 1 failed, 0 skipped, 0 blacklisted, 1ms
6: ********* Finished testing of DeviceGlobalsTest *********
6/7 Test #6: k3bdeviceglobalstest .............***Failed 0.07 sec
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