On 16 January 2014 12:12, Alex Velenko <alex.vele...@arm.com> wrote: > This patch implements test cases for following NEON intrinsics: > vdup_lane_f32 > vdup_lane_s[8,16] > vdup_lane_s[32,64] > vdup_n_[p,s,u][8,16] > vdup_n_[s,u][32,64] > > vdupb_lane_[s,u]8 > vduph_lane_[s,u]16 > vdupd_lane_[f,s,u]64 > vdups_lane_[f,s,u]32 > > vdupq_lane_[f,s][32,64] > vdupq_lane_s[8,16] > vdup[q]_n_f32 > vdupq_n_f64 > vdupq_n_[s,p,u][8,16] > vdupq_n_[s,u][32,64]
+int +__attribute__ ((noinline)) test_vdupq_lane_s16 () The function name should be placed in column1, hence the above should be written: int __attribute__ ((noinline)) test_vdupq_lane_s16 () +/* Covers vdups_lane_f32, vdups_lane_s32, vdups_lane_u32. */ +/* { dg-final { scan-assembler-times "dup\\ts\[0-9\]+, v\[0-9\]+\.s\\\[0\\\]" 3 } } */ +/* { dg-final { scan-assembler-times "dup\\ts\[0-9\]+, v\[0-9\]+\.s\\\[1\\\]" 3 } } */ + +#212 "/work/tempdev//src/gcc/gcc/testsuite/gcc.target/aarch64/vdup_lane_2.c" This should not be here. Cheers /Marcus