> I'm not opposed to refactoring but what's the reason for it? We have a large > number of similar tests that also include all possible types. And aren't all > the tests you touch FAILing anyway right now? (Due to the combine change...)
Yes, the cond_widen_complicate-3 need some tweak for the asm check failure. Simply adjust the count cannot guarantee that each type has generated at least one vw/vfw. For example, i8 doesn't generate vw but i16 generate 2 vw insn, and the final asm check times is the same. Thus, I refactor them into different types to meet current behavior. Pan -----Original Message----- From: Robin Dapp <rdapp....@gmail.com> Sent: Wednesday, March 12, 2025 7:11 PM To: Li, Pan2 <pan2...@intel.com>; gcc-patches@gcc.gnu.org Cc: juzhe.zh...@rivai.ai; kito.ch...@gmail.com; jeffreya...@gmail.com; Chen, Ken <ken.c...@intel.com>; Robin Dapp <rdapp....@gmail.com> Subject: Re: [PATCH v1] RISC-V: Refine the testcases for cond_widen_complicate-3 > From: Pan Li <pan2...@intel.com> > > Rearrange the test cases of cond_widen_complicate-3 by different types > into different files, instead of put all types together. Then we can > easily reduce the range when asm check fails. I'm not opposed to refactoring but what's the reason for it? We have a large number of similar tests that also include all possible types. And aren't all the tests you touch FAILing anyway right now? (Due to the combine change...) -- Regards Robin
