On Tue, 13 Jan 2015, Andrew Bennett wrote:
> The call-saved-{4-6}.c tests in the mips testsuite fail for micromips. The
> reason is
> that micromips uses the swm and lwm instructions to save/restore the
> call-saved registers
> rather than using the sw and lw instructions. The swm and lwm instructions
> only list
> the range of registers to use ie. $16-$25 and hence some of the
> scan-assembler
> patterns fail. This fix adds the NO_COMPRESSION attribute to the foo
> function to
> force the tests to always compile as mips.
>
> I have tested this for both mips and micromips, and the tests now pass
> successfully.
> The ChangeLog and patch are below.
Hmm, instead of trying to avoid testing microMIPS code generation just to
satisfy the test suite I'd rather see the test cases updated so that
LWM/SWM register ranges are expected and accepted whenever microMIPS code
is produced. These scan patterns can be made conditional.
Maciej
