[Bug testsuite/70150] Additonal test failures with --enable-default-pie

[cvs-commit at gcc dot gnu.org via Gcc-bugs]

https://gcc.gnu.org/bugzilla/show_bug.cgi?id=70150

--- Comment #28 from CVS Commits <cvs-commit at gcc dot gnu.org> ---
The master branch has been updated by Xi Ruoyao <xry...@gcc.gnu.org>:

https://gcc.gnu.org/g:7e8a3dbbb26f66ce8ea60be48962022b5fb2ef55

commit r13-6518-g7e8a3dbbb26f66ce8ea60be48962022b5fb2ef55
Author: Xi Ruoyao <xry...@xry111.site>
Date:   Sat Sep 24 14:45:17 2022 +0800

    aarch64: testsuite: disable PIE for fuse_adrp_add_1.c [PR70150]

    In PIE, symbol "fixed_regs" is addressed via GOT.  It will break the
    scan-assembler pattern and cause test failure with --enable-default-pie.

    gcc/testsuite/ChangeLog:

            PR testsuite/70150
            * gcc.target/aarch64/fuse_adrp_add_1.c (dg-options): Add
            -fno-pie.