[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

[rearnsha at gcc dot gnu.org]

https://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664

Richard Earnshaw <rearnsha at gcc dot gnu.org> changed:

           What    |Removed                     |Added
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             Status|NEW                         |RESOLVED
         Resolution|---                         |FIXED

--- Comment #16 from Richard Earnshaw <rearnsha at gcc dot gnu.org> ---
neon-testgen.ml has now been deleted.