[Bug testsuite/53664] New: neon-testgen.ml generates duplicate scan-assembler directives

[janis at gcc dot gnu.org]

http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664

             Bug #: 53664
           Summary: neon-testgen.ml generates duplicate scan-assembler
                    directives
    Classification: Unclassified
           Product: gcc
           Version: 4.8.0
            Status: UNCONFIRMED
          Severity: normal
          Priority: P3
         Component: testsuite
        AssignedTo: unassig...@gcc.gnu.org
        ReportedBy: ja...@gcc.gnu.org
            Target: arm


Tests gcc/testsuite/gcc.target/arm/neon/v*.c are generated by the script
gcc/config/arm/neon-testgen.ml.  54 of these tests have duplicate
scan-assembler test directives, leading to duplicate lines in the test summary
file.  The test generator is an O'Caml program.

I'm hoping that someone who knows that language will kindly take a look at this
bug, fix it, and regenerate the tests.