Hi All,

I have been testing more power supplies and have concluded that most power 
supplies are capable of having a single 1400 Volt EFT-like pulse breaking over 
the isolation barrier in the supply with multiple breakdowns per EFT pulse. 
These pulses are very common in the electrical environment, usually coming as a 
burst up with to a 10 MHz repetition rate within the burst.

These breakdowns are likely the cause of many pulsed immunity test failures.

I am building V2.0 of the pulser and will start looking for isolation barrier 
degradation over time and breakdowns as above. I am planning 500,000+ EFT line 
pulses at one per second over several days as an accelerated life test.

Right now I am planning to present and publish my results at the EOS/ESD 
Symposium later this year but will do a "preview" of my preliminary results 
mid-next week. Contact me privately if you are interested.

Doug Smith
Sent from my iPhone
IPhone: 408-858-4528
Office: 702-570-6108
Email: d...@dsmith.org
Website: http://dsmith.org

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