Scaling Root Processes: Global Impacts (supported by the Department of Energy, Terrestrial Ecosystem Science)
Key Bridge Marriot, Arlington, VA, USA, March 7-9, 2012 The goals of this workshop is to bring together a diverse community of scientists with interest in the processes and modeling of root ecology. The workshop will identify the state of the science in the understanding and modeling of critical root ecological processes; gaps and/or deficiencies in current process knowledge and model representations; and a path forward to provide the necessary process understanding/observations and model improvements to robustly incorporate root dynamics and plant-soil-microbe continuum processes into models. For more information please visit: <http://www.bio.anl.gov/ScalingRootProcesses-GlobalImpactsWorkshop/> http://www.bio.anl.gov/ScalingRootProcesses-GlobalImpactsWorkshop/ Graduate Student and Postdoc participation Graduate students and postdocs are encouraged to submit abstracts to participate in the workshop. We would like to receive abstracts describing your current research on root ecology, root/belowground modeling and incorporation of root dynamics/soil processes into high scale models. Abstracts will be evaluated by the Workshop Organizing Committee based on their relevance to the workshop objectives as well as by their scientific quality. The abstract should include a title and authors affiliation. The text should not include graphics, it should focus on your research results up to 300 words. The abstract should be submitted as a pdf file. Name your file with your name and the workshop session your work applies to. Send your abstracts to David Eissenstat: [email protected] Attention: Abstracts are due Feb 12, 2012. Travel Awards We expect to have 10 travel awards, funded by the National Science Foundation, Division of Environmental Biology. Five to six abstracts will be chosen for oral presentations and they will be awarded a travel award of up to $1000. Four to five invited posters will be awarded up to $500.
