Hi Jasvinder, > -----Original Message----- > From: Singh, Jasvinder > Sent: Wednesday, March 29, 2017 1:42 PM > To: dev@dpdk.org > Cc: olivier.m...@6wind.com; Doherty, Declan; De Lara Guarch, Pablo > Subject: [PATCH v6 2/2] test/test: add unit test for CRC computation > > This patch provides a set of tests for verifying the functional > correctness of 16-bit and 32-bit CRC APIs. > > Signed-off-by: Jasvinder Singh <jasvinder.si...@intel.com> > --- > test/test/Makefile | 2 + > test/test/test_crc.c | 241 > +++++++++++++++++++++++++++++++++++++++++++++++++++ > 2 files changed, 243 insertions(+) > create mode 100644 test/test/test_crc.c >
... > diff --git a/test/test/test_crc.c b/test/test/test_crc.c > new file mode 100644 > index 0000000..c25790d > --- /dev/null > +++ b/test/test/test_crc.c > @@ -0,0 +1,241 @@ ... > +static int > +test_crc_scalar(void) Could you merge this and the next function in a single one, as they are duplicated (except for the comments/printfs, which can be a parameter of the function). Apart from this: Acked-by: Pablo de Lara <pablo.de.lara.gua...@intel.com>
