The BPF tests registered 23 separate autotests. Collapse them into a single bpf_autotest suite run by unit_test_suite_runner().
Rename the old table-driven test_bpf() to test_bpf_progs() so that test_bpf() can be the suite entry point. Move the #endif of the RTE_LIB_BPF guard to the end of the file. It closed mid-file, leaving the stack, ELF, convert and atomic tests outside the guard even though they all call rte_bpf functions. Signed-off-by: Stephen Hemminger <[email protected]> --- app/test/test_bpf.c | 86 +++++++++++++++++++++++++++++---------------- 1 file changed, 56 insertions(+), 30 deletions(-) diff --git a/app/test/test_bpf.c b/app/test/test_bpf.c index d85e64e7fb..7f235720e7 100644 --- a/app/test/test_bpf.c +++ b/app/test/test_bpf.c @@ -27,6 +27,8 @@ test_bpf(void) return TEST_SKIPPED; } +REGISTER_FAST_TEST(bpf_autotest, NOHUGE_OK, ASAN_OK, test_bpf); + #else #include <rte_bpf.h> @@ -92,7 +94,6 @@ test_no_instructions(void) return bpf_load_test(RTE_DIM(ins), ins, EINVAL); } -REGISTER_FAST_TEST(bpf_no_instructions_autotest, NOHUGE_OK, ASAN_OK, test_no_instructions); /* * Try and load a BPF program comprising single EXIT instruction. @@ -109,7 +110,6 @@ test_exit_only(void) return bpf_load_test(RTE_DIM(ins), ins, EINVAL); } -REGISTER_FAST_TEST(bpf_exit_only_autotest, NOHUGE_OK, ASAN_OK, test_exit_only); /* * Try and load a BPF program with no EXIT instruction. @@ -129,7 +129,6 @@ test_no_exit(void) return bpf_load_test(RTE_DIM(ins), ins, EINVAL); } -REGISTER_FAST_TEST(bpf_no_exit_autotest, NOHUGE_OK, ASAN_OK, test_no_exit); /* * Try and load smallest possible valid BPF program. @@ -151,7 +150,6 @@ test_minimal_working(void) return bpf_load_test(RTE_DIM(ins), ins, 0); } -REGISTER_FAST_TEST(bpf_minimal_working_autotest, NOHUGE_OK, ASAN_OK, test_minimal_working); /* * Try and load valid BPF program adding one to the argument. @@ -179,7 +177,6 @@ test_add_one(void) return bpf_load_test(RTE_DIM(ins), ins, 0); } -REGISTER_FAST_TEST(bpf_add_one_autotest, NOHUGE_OK, ASAN_OK, test_add_one); /* * Try and load valid BPF program subtracting one from the argument. @@ -207,7 +204,6 @@ test_subtract_one(void) return bpf_load_test(RTE_DIM(ins), ins, 0); } -REGISTER_FAST_TEST(bpf_subtract_one_autotest, NOHUGE_OK, ASAN_OK, test_subtract_one); /* * Conditionally jump over invalid operation as first instruction. @@ -243,8 +239,6 @@ test_jump_over_invalid_first(void) return bpf_load_test(RTE_DIM(ins), ins, EINVAL); } -REGISTER_FAST_TEST(bpf_jump_over_invalid_first_autotest, NOHUGE_OK, ASAN_OK, - test_jump_over_invalid_first); /* * Conditionally jump over invalid operation as non-first instruction. @@ -286,8 +280,6 @@ test_jump_over_invalid_non_first(void) return bpf_load_test(RTE_DIM(ins), ins, EINVAL); } -REGISTER_FAST_TEST(bpf_jump_over_invalid_non_first_autotest, NOHUGE_OK, ASAN_OK, - test_jump_over_invalid_non_first); /* * Basic functional tests for librte_bpf. @@ -3796,7 +3788,6 @@ test_bpf_load_null(void) return 0; } -REGISTER_FAST_TEST(bpf_load_null_autotest, NOHUGE_OK, ASAN_OK, test_bpf_load_null); /* Test calling wrong API for execution of a multi-argument eBPF program. */ static int @@ -3837,8 +3828,6 @@ test_bpf_exec_wrong_nb_prog_arg(void) return 0; } -REGISTER_FAST_TEST(bpf_exec_wrong_nb_prog_arg_autotest, NOHUGE_OK, ASAN_OK, - test_bpf_exec_wrong_nb_prog_arg); /* Test passing unsupported flags when executing an eBPF program. */ static int @@ -3876,10 +3865,9 @@ test_bpf_exec_wrong_flags(void) return 0; } -REGISTER_FAST_TEST(bpf_exec_wrong_flags_autotest, NOHUGE_OK, ASAN_OK, test_bpf_exec_wrong_flags); static int -test_bpf(void) +test_bpf_progs(void) { int32_t rc, rv; uint32_t i; @@ -3894,10 +3882,6 @@ test_bpf(void) return rc; } -#endif /* !RTE_LIB_BPF */ - -REGISTER_FAST_TEST(bpf_autotest, NOHUGE_OK, ASAN_OK, test_bpf); - /* Tests of BPF JIT stack alignment when calling external functions (xfuncs). */ /* Function called from the BPF program in a test. */ @@ -4010,7 +3994,6 @@ test_stack_alignment(void) return TEST_SUCCESS; } -REGISTER_FAST_TEST(bpf_stack_alignment_autotest, NOHUGE_OK, ASAN_OK, test_stack_alignment); /* * Test copying `__uint128_t`. @@ -4066,7 +4049,6 @@ test_stack_copy_uint128(void) #endif -REGISTER_FAST_TEST(bpf_stack_copy_uint128_autotest, NOHUGE_OK, ASAN_OK, test_stack_copy_uint128); /* * Test SSE2 load and store intrinsics. @@ -4152,7 +4134,6 @@ test_stack_sse2(void) #endif -REGISTER_FAST_TEST(bpf_stack_sse2_autotest, NOHUGE_OK, ASAN_OK, test_stack_sse2); /* * Run memcpy and rte_memcpy with various data sizes and offsets (unaligned and aligned). @@ -4285,7 +4266,6 @@ test_stack_memcpy(void) return TEST_SUCCESS; } -REGISTER_FAST_TEST(bpf_stack_memcpy_autotest, NOHUGE_OK, ASAN_OK, test_stack_memcpy); /* * The BPF elf load test needs the BPF programs to be successfully @@ -4801,7 +4781,6 @@ test_bpf_elf(void) #endif /* !(TEST_BPF_ELF_LOAD && RTE_NULL) */ -REGISTER_FAST_TEST(bpf_elf_autotest, NOHUGE_OK, ASAN_OK, test_bpf_elf); #ifndef RTE_HAS_LIBPCAP @@ -5087,7 +5066,6 @@ test_bpf_convert(void) #endif /* RTE_HAS_LIBPCAP */ -REGISTER_FAST_TEST(bpf_convert_autotest, NOHUGE_OK, ASAN_OK, test_bpf_convert); /* * Tests of BPF atomic instructions. @@ -5244,7 +5222,6 @@ test_xadd32(void) return run_xchg_test(RTE_DIM(ins), ins, expected); } -REGISTER_FAST_TEST(bpf_xadd32_autotest, NOHUGE_OK, ASAN_OK, test_xadd32); /* * Test 64-bit XADD. @@ -5313,7 +5290,6 @@ test_xadd64(void) return run_xchg_test(RTE_DIM(ins), ins, expected); } -REGISTER_FAST_TEST(bpf_xadd64_autotest, NOHUGE_OK, ASAN_OK, test_xadd64); /* * Test 32-bit XCHG. @@ -5408,7 +5384,6 @@ test_xchg32(void) return run_xchg_test(RTE_DIM(ins), ins, expected); } -REGISTER_FAST_TEST(bpf_xchg32_autotest, NOHUGE_OK, ASAN_OK, test_xchg32); /* * Test 64-bit XCHG. @@ -5473,7 +5448,6 @@ test_xchg64(void) return run_xchg_test(RTE_DIM(ins), ins, expected); } -REGISTER_FAST_TEST(bpf_xchg64_autotest, NOHUGE_OK, ASAN_OK, test_xchg64); /* * Test invalid and unsupported atomic imm values (also valid ones for control). @@ -5546,4 +5520,56 @@ test_atomic_imms(void) return TEST_SUCCESS; } -REGISTER_FAST_TEST(bpf_atomic_imms_autotest, NOHUGE_OK, ASAN_OK, test_atomic_imms); +static struct unit_test_suite test_bpf_suite = { + .suite_name = "BPF Unit Test Suite", + .unit_test_cases = { + /* Loading of the most simple programs. */ + TEST_CASE(test_no_instructions), + TEST_CASE(test_exit_only), + TEST_CASE(test_no_exit), + TEST_CASE(test_minimal_working), + TEST_CASE(test_add_one), + TEST_CASE(test_subtract_one), + TEST_CASE(test_jump_over_invalid_first), + TEST_CASE(test_jump_over_invalid_non_first), + + /* API misuse. */ + TEST_CASE(test_bpf_load_null), + TEST_CASE(test_bpf_exec_wrong_nb_prog_arg), + TEST_CASE(test_bpf_exec_wrong_flags), + + /* Execution of the programs in the tests[] table. */ + TEST_CASE(test_bpf_progs), + + /* JIT stack alignment when calling external functions. */ + TEST_CASE(test_stack_alignment), + TEST_CASE(test_stack_copy_uint128), + TEST_CASE(test_stack_sse2), + TEST_CASE(test_stack_memcpy), + + /* Loading of programs from ELF objects. */ + TEST_CASE(test_bpf_elf), + + /* Conversion of cBPF programs. */ + TEST_CASE(test_bpf_convert), + + /* Atomic instructions. */ + TEST_CASE(test_xadd32), + TEST_CASE(test_xadd64), + TEST_CASE(test_xchg32), + TEST_CASE(test_xchg64), + TEST_CASE(test_atomic_imms), + + TEST_CASES_END() + } +}; + +static int +test_bpf(void) +{ + return unit_test_suite_runner(&test_bpf_suite); +} + +REGISTER_FAST_TEST(bpf_autotest, NOHUGE_OK, ASAN_OK, test_bpf); + +#endif /* !RTE_LIB_BPF */ -- 2.53.0
