> Subject: [PATCH v2 0/7] Improvements and new test cases > > v2: > * Remove unused variables from tests for padding corruption. > > Adding new test cases and improvements to test application. > > Aakash Sasidharan (4): > test/crypto: add combined mode cases for TLS 1.3 > test/security: add TLS 1.3 data walkthrough tests > test/security: add out of place sgl tests for TLS > test/security: use single session in data walkthrough test > > Vidya Sagar Velumuri (3): > test/crypto: unit tests for padding for TLS-1.3 > test/crypto: verify padding corruption in TLS-1.2 > test/crypto: verify padding corruption in DTLS-1.2 > > app/test/test_cryptodev.c | 214 ++++++++++++++++-- > app/test/test_cryptodev_security_tls_record.c | 7 + > app/test/test_cryptodev_security_tls_record.h | 2 + > 3 files changed, 201 insertions(+), 22 deletions(-) > Series Acked-by: Akhil Goyal <gak...@marvell.com>
Applied to dpdk-next-crypto Changed patch titles. Please review and take care in future.
<<attachment: winmail.dat>>
